A specialty of Fike Analytical Technologies, LLC, in depth particulate analysis utilizes the latest Scanning Electron Microscope (SEM) technology.

The SEM, equipped with an Energy Dispersive X-Ray spectrometer, makes it possible to not only examine the appearance (morphology) of individual particles but also to determine the elemental content of those particles, even particles as small as only 0.05 µm in diameter.

This analytical capability has been applied to clean rooms, wild fire impact, particulate contamination in manufactured items, neighborhood fallout, particle sizing, fertility clinics, insurance investigations of fire loss, and many more.  Call us at 248-241-6713 to discuss your specific application.